Artículos regulares in revistas
|A simple method for the determination of strains in epitaxial films: Application to Eu(110) deposited on a Nb(110) buffer|
|Soriano S., Gourieux T., Stunault A., Dumesnil K., Dufour C.|
|European Physical Journal B 48 (2005) 167|
|DOI : 10.1140/epjb/e2005-00400-4|
In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film.