Artículos regulares in revistas
| A simple method for the determination of strains in epitaxial films: Application to Eu(110) deposited on a Nb(110) buffer |
| Soriano S., Gourieux T., Stunault A., Dumesnil K., Dufour C. |
| European Physical Journal B 48 (2005) 167 |
| DOI : 10.1140/epjb/e2005-00400-4 |
In order to determine the strain tensor in a 375 nm thick Eu(110) epitaxial thin film, we have developed a new method, based on the accurate determination of the lattice vectors by high resolution X-ray diffraction. We show that a biaxial strain model gives a good representation of the state of the strains field in the film. |